Software Development Engineer (SDE)
Interview Date
2025
Result
Not Specified
Difficulty
Medium (Online Coding Test)
Rounds
3 rounds (Online Coding Test, Technical Interview Round 1, Technical Interview Round 2)
Drive Type
On-campus, Full-Time
Topics asked
Detailed experience
College: Not Specified
Interview Date: 2025
Interview Type: On-campus, Full-Time
Result: Not Specified
Difficulty: Medium (Online Coding Test)
Rounds: 3 rounds (Online Coding Test, Technical Interview Round 1, Technical Interview Round 2)
Topics Asked: Coding (String-based, Array-based), SQL, DBMS, DSA (recursion, Linked List, array), Java concepts (OOP, Collections, exception handling), Project Discussion, Behavioral
The interview process for the SDE role at HashedIn by Deloitte (on-campus) in 2025 started with an Online Coding Test. This test included three medium-difficulty questions: two string-based problems (pattern checking and manipulation) and one array-based problem (prefix sums and optimization). The candidate successfully solved all three with full test cases passing.
Technical Interview Round 1 covered SQL questions (basic queries, aggregate functions, filtering with WHERE and GROUP BY), DSA questions (one based on recursion, one on Linked List, and one on array), and questions about internships (explanation, tools used, challenges). Java concepts like OOP, Collections, and exception handling were also discussed.
Technical Interview Round 2 involved an in-depth discussion of projects listed on the resume, focusing on architecture, tech stack, challenges, and how they were handled. More advanced SQL & DBMS topics were covered, including different types of joins (inner, left, right, full), normalization (1NF, 2NF, 3NF), and ER Diagrams (drawing and explaining entity relationships). The round also included HR-type questions about the candidate's current role, responsibilities, motivations, and long-term goals. Tips for success included thorough preparation in SQL, DBMS, and Java basics, clear project explanations, and practicing medium-level DSA problems.